Scanning Electron Microscope (SEM)

    Facility/equipment: Equipment

    Equipments Details

    Description

    This instrument is used for structure and surface analysis.
    It provides a 3D picture acquired from generating of electron signal including Secondary signal detector and Backscattered electron.
    It can accelerate voltage and magnify up to 30 kV and 300,000X, respectively.
    Elemental composition can be analyzed (Be to Pu) with Energy Dispersive X-ray spectroscopy (EDS).

    Details

    NameJEOL-JSM-IT500LA

    Keywords

    • QR180 Immunology
    • Q Science (General)
    • QC Physics

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